Search results for Atomic Force Microscope
Industry
Tech Developers Day designated as statutory national commemoration; 55 R&D contributors honoured
South Korea has designated Tech Developers Day as a statutory national commemoration for the first time this year to recognise the work of research and development personnel. The Ministry of Science and ICT held a ceremony in Seoul on Sept. 7 and presented awards to researchers and companies that contributed to strengthening technological competitiveness. The ministry said it granted 55 government awards, including medals, orders and presidential and prime ministerial citations, along with additional vice prime minister citations and outstanding researcher awards.
AI & Enterprise
KAIST develops structure to ease electrical bottleneck in 2D semiconductors
A South Korean research team has developed a structure that could ease an “electrical bottleneck” that reduces performance and power efficiency in next-generation semiconductors. KAIST said its team built a continuous semimetal and semiconductor structure within a single thin film of platinum diselenide and created an analysis platform to directly observe current flow. The team visualized nanoscale charge movement with atomic force microscopy and verified operation by applying an electric field.
Industry
KAIST sets AFM roadmap for designing next-generation advanced materials
KAIST said a research team led by materials science professor Seungbeom Hong (홍승범) published a review paper that organises atomic force microscope (AFM)-based ferroelectric research strategies and presents analysis and manipulation guidelines. The team proposed an integrated framework combining techniques including PFM, KPFM and C-AFM to capture material structure and charge distribution at the nanoscale. The paper also highlighted applications to materials such as MoS2 and ultrathin HfZrO2 systems, and suggested combining high-speed AFM with AI.