AI & Enterprise
KAIST develops automated screening technology for 2D semiconductors
KAIST said on Wednesday its researchers developed a technology that automatically screens 2D semiconductors using only optical microscope images and connects the process to transistor fabrication. The joint study used molybdenum disulfide and differences in RGB brightness by thickness to automate selection and electrode design. Verified with atomic force microscopy, the method distinguished 3 to 8 layers, screened suitable samples from more than 120,000 flakes, and produced and analyzed 1,615 transistors.